Andor Technology has introduced the new iKon-XL “open-front” (‘SO’) 16-Megapixel CCD camera platform for vacuum ultraviolet (VUV) and soft X-ray direct detection. This new camera platform is based on back-illuminated CCD231-84 and CCD230-80 sensor variants from e2v delivering up to 95% QE, with deep depletion options for enhanced sensitivity in the 4–10 keV region, down to 2 e- read noise and up to 350,000 e- pixel well depth. Its maintenance-free deep-TE cooling down to –75°C minimises sensor dark current and enables the use of long exposure times for weak signal detection, without the need for liquid nitrogen or cryo-coolers. The iKon-XL “SO” is suited for large field-of-view laboratory-based or synchrotron-based X-ray diffraction, X-ray plasma imaging and spectroscopy or X-ray microscopy experiments. New “Extended Dynamic Range” technology allows simultaneous access to the lowest noise and maximum well depth within one scan and is complemented by up to 18-bit digitisation capability. Flexible connectivity is standard through either USB 3.0 or a long distance direct fibre-optic interface. Images can be read out at a range of readout speeds via either single or quad ports, the latter benefiting from the design attention given to electronic stability and image quadrant balancing. The iKon-XL “SO” comes with a standard DN160CF/8” CF/CF-203 rotatable flange and a metal-to-metal knife-edge sealing interface for seamless integration with ultrahigh vacuum chambers.