Czitek’s Film SurveyIR is a grazing angle FT-IR microscope for thin film (<1 µm) characterisation. It uses the external output beam of a FT-IR spectrometer with optics that direct the beam to the sample at 60–85° from normal. At these angles, there is increased sensitivity to thin films on surfaces. Automated aperture masks isolate microscopic areas for measurement and a megapixel camera provides sample observation and documentation.