The EDX-8100 energy dispersive x-ray fluorescence (ED-XRF) spectrometer incorporates a revamped semiconductor detector (SDD) with a special ultra-thin-film window material. An improved detector offers a high fluorescent x-ray count per unit time to increase throughput and provide compatibility with helium purging. When configured with an optional helium purge unit, the EDX-8100 is capable of the high-sensitivity analysis of elements, including light elements (fluorine to aluminium), in samples that cannot be depressurised to a vacuum state, such as liquid samples and those containing water or oils. The EDX-8100 is equipped with five primary filters that enable highly sensitive analysis of trace elements and a sample observation camera for precise sample positioning.