Articles
Reverse engineering of polymeric multilayers using AFM-based nanoscale IR spectroscopy and thermal analysis
It is possible to obtain both infrared spectra and thermal analysis data of individual layers in a cross-sectioned multilayer film. Since both techniques are AFM-based, the topographical features can be readily linked to the spectroscopic and thermal data at a much higher spatial resolution than previously achievable.
Article | Issue 24/3 (2012)